ECE 521 Fault-Tolerant Computer Design
Concepts of error detection, location and correction in digital systems. Codes for error detection and correction. Models and simulations of faults. Design of tests for combinational and sequential circuits. Testability. Design of digital systems with testability.
Credit Hours: 3 Lecture
Prerequisites: ECE
423, ECE 425, or consent of instructor
Course Coordinator:
Dimitri Kagaris
Textbooks:
“Digital Systems Testing and Digital Design,” M. Abramovici, M. Breuer, A. Friedman, IEEE Press, 1990.
References:
“Engineering Reliability,” R. Ramakumar, Prentice-Hall, 1993.
“Essentials of Error Control Coding Techniques,” H. Imai (Editor), Academic Press, 1990.
Selected papers from IEEE Transactions journals and IEEE Conference Proceedings.
Goals:
To provide graduate students with the ability to design and analyze basic mixed-signal VLSI circuits.
Emphasis is placed on digital-to-analog and analog-to-digital converter circuits.
Projects:
Selected projects on test pattern generation, simulation, design for testability.
Computer Tools: Cadence
Last Review: Spring Semester 2004
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