ECE 522 VLSI Circuit Testing
Theoretical and practical aspects of production testing of VLSI circuits. Relations between physical defects and fault models. Procedures for generating test inputs. Design modifications for test applications and theory of built-in self-test.
Credit Hours: 3 Lecture
Prerequisites:
ECE 425 or consent of instructor
Textbooks:
“Essentials of Electronic Testing for Digital, Memory & Mixed Signal VLSI Circuits”. M.L.
Bushnell & V.D. Agrawal, Springer, 2000, ISBN: 9780792379911.
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