Department of Electrical and Computer Engineering

ECE 522 VLSI Circuit Testing

Theoretical and practical aspects of production testing of VLSI circuits. Relations between physical defects and fault models. Procedures for generating test inputs. Design modifications for test applications and theory of built-in self-test.

Credit Hours: 3 Lecture

Prerequisites: ECE 425 or consent of instructor

Course Coordinator: Spyros Tragoudas

Textbooks:

1. “Essentials of Electronic Testing for Digital, Memory & Mixed Signal VLSI Circuits”. M.L. Bushnell & V.D. Agrawal, Springer, 2000, ISBN: 0-7923-7991-8.

References:

1. “Digital Systems Testing and Testable Design”, M. Abramovici, M.A. Breuer, A.D. Friedman, Computer Science Press, 1990.

2. Papers from journals and conference proceedings.

Goals:

1. To provide graduate students with the ability to test digital VLSI circuits and systems.

2. Emphasis is placed on automatic test pattern generation for random logic and memory.

Projects:

1. Design of fault grading and automatic test pattern generation tools for the single stuck-at fault model.

2. Design of fault grading and automatic test pattern generation tools for the single stuck-at fault model.

3. Design of a tool for reduced test application time in full scan environments.

Computer Tools: Cadence, CUDD, GRASP

Last Review: Spring Semester 2004